Ultrafast Charge Carrier Recombination and Trapping in Hematite Photoanodes under Applied Bias

نویسندگان

  • Stephanie R Pendlebury
  • Xiuli Wang
  • Florian Le Formal
  • Maurin Cornuz
  • Andreas Kafizas
  • S. David Tilley
  • Michael Grätzel
  • James R Durrant
چکیده

Transient absorption spectroscopy on subpicosecond to second time scales is used to investigate photogenerated charge carrier recombination in Si-doped nanostructured hematite (α-Fe2O3) photoanodes as a function of applied bias. For unbiased hematite, this recombination exhibits a 50% decay time of ~6 ps, ~10(3) times faster than that of TiO2 under comparable conditions. Anodic bias significantly retards hematite recombination dynamics, and causes the appearance of electron trapping on ps-μs time scales. These ultrafast recombination dynamics, their retardation by applied bias, and the associated electron trapping are discussed in terms of their implications for efficient water oxidation.

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عنوان ژورنال:

دوره 136  شماره 

صفحات  -

تاریخ انتشار 2014